Open AccessRELIABILITY METRICS BASED ON THE DEPENDENCE OF DEFECTS ON SOURCE CODE COMPLEXITY
Author(s) -
Svitlana Yaremchuck
Publication year - 2018
Language(s) - English
DOI - 10.32836/2521-6643-2018.2-56.2
Subject(s) - reliability (semiconductor) , code (set theory) , reliability engineering , computer science , source code , programming language , physics , engineering , power (physics) , set (abstract data type) , quantum mechanics