
Negative ion formation during scattering of H-atom from-Al (111) Thin Films: Using Perturbative method
Author(s) -
Hayfaa A. Jassem,
Z. Hassan
Publication year - 2019
Publication title -
university of thi-qar journal of science
Language(s) - English
DOI - 10.32792/utq/utjsci/vol4/4/33
Subject(s) - scattering , ion , atom (system on chip) , thin film , atomic physics , physics , materials science , optics , nanotechnology , quantum mechanics , computer science , embedded system