Open AccessUsing the elman neural network as an identity map in defect detection task
Author(s) -
Volodymyr Khandetskyi,
N. V. Karpenko
Publication year - 2020
Language(s) - English
DOI - 10.32782/cmis/2608-64
Subject(s) - task (project management) , artificial neural network , identity (music) , artificial intelligence , pattern recognition (psychology) , computer science , engineering , art , aesthetics , systems engineering
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