Open AccessDevelopment of JEM-ARM300F2: an aberration corrected 300 kV microscope capable of both ultrahigh spatial resolution imaging and highly sensitive analysis over a wide range of acceleration voltage
Author(s) -
Yu Jimbo,
Hiroki Hashiguchi,
Ichiro Ohnishi
Publication year - 2020
Language(s) - English
DOI - 10.32757/2619-0923.2020.3-4.13.30.36
Subject(s) - acceleration voltage , image resolution , materials science , microscope , acceleration , resolution (logic) , optics , range (aeronautics) , voltage , optoelectronics , physics , computer science , nuclear physics , classical mechanics , quantum mechanics , artificial intelligence , cathode ray , composite material , electron