Open AccessElectrical Safety Related Isolation on Industrial Machines with Multiple Entry Points
Author(s) -
Sathish Kumar R,
Ravi Shankar R,
S. Sathish
Publication year - 2022
Publication title -
international journal of scientific research in science, engineering and technology
Language(s) - English
Resource type - Journals
eISSN - 2395-1990
pISSN - 2394-4099
DOI - 10.32628/ijsrset229464
Subject(s) - reliability (semiconductor) , reliability engineering , isolation (microbiology) , point (geometry) , control (management) , computer science , electrical equipment , engineering , automotive engineering , electrical engineering , power (physics) , physics , geometry , microbiology and biotechnology , mathematics , quantum mechanics , artificial intelligence , biology