Open AccessA Survey on Test pattern compression Techniques in Analog and Mixed signal circuits
Author(s) -
J. Poornimasre,
R. Harikumar,
P. Saravanakumar
Publication year - 2019
Publication title -
international journal of research in advent technology
Language(s) - English
Resource type - Journals
ISSN - 2321-9637
DOI - 10.32622/ijrat.76201902
Subject(s) - mixed signal integrated circuit , analogue electronics , test (biology) , analog signal , computer science , signal (programming language) , compression (physics) , electronic circuit , signal compression , electronic engineering , computer hardware , engineering , signal processing , electrical engineering , materials science , digital signal processing , geology , paleontology , programming language , composite material