Open AccessAn Expected Patch Log Likelihood Denoising Method Based on Internal and External Image Similarity
Author(s) -
Xu Pin,
Jianwei Zhang
Publication year - 2020
Publication title -
journal on internet of things
Language(s) - English
Resource type - Journals
eISSN - 2579-0099
pISSN - 2579-0080
DOI - 10.32604/jiot.2020.09073
Subject(s) - similarity (geometry) , image (mathematics) , pattern recognition (psychology) , noise reduction , artificial intelligence , mathematics , computer science , statistics