Open AccessA new approach to process gamma scattering spectra for aluminum materials
Author(s) -
Nguyen Hoang Vo,
Trung Quang Tran,
Binh X. Nguyen,
Thanh Nguyen The Cao,
Tạo Văn Châu
Publication year - 2019
Publication title -
khoa học và công nghệ: tự nhiên
Language(s) - English
Resource type - Journals
ISSN - 2588-106X
DOI - 10.32508/stdjns.v2i4.814
Subject(s) - scattering , spectral line , monte carlo method , aluminium , detector , component (thermodynamics) , computational physics , physics , materials science , gamma ray , optics , nuclear physics , mathematics , statistics , composite material , thermodynamics , astronomy
In this study, we used Monte Carlo method to simulate each separate component of the gamma scattering spectrum. The gamma rays emitted from a 137Cs source, scatter on aluminum targets and recorded by a NaI(Tl) detector. Based on the distribution characteristics of each scattering component, we propose a new method to analyze scattered gamma spectra. This method was applied for simulated spectra to estimate the material thickness gives good results.