Open AccessDesign of On-Chip Testing Memory for High Speed Circuits
Author(s) -
M.V. Sushumna,
Hyderabad Ece
Publication year - 2014
Publication title -
cvr journal of science and technology/cvr journal of science and technology
Language(s) - English
Resource type - Journals
eISSN - 2581-7957
pISSN - 2277-3916
DOI - 10.32377/cvrjst0606
Subject(s) - chip , electronic circuit , computer science , engineering , electrical engineering , telecommunications