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A SEM-X-Ray assisted experimental approach for the determination of mechanical and thermal load – induced damage in MMCs
Author(s) -
V. N. Kytopoulos,
E. Sideridis,
J. Venetis,
Chrysoula Riga,
A. F. Altzoumailis
Publication year - 2019
Publication title -
frattura ed integrità strutturale
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.368
H-Index - 19
ISSN - 1971-8993
DOI - 10.3221/igf-esis.50.35
Subject(s) - materials science , composite material , electron microprobe , scanning electron microscope , mechanical load , tension (geology) , enhanced data rates for gsm evolution , ultimate tensile strength , stress (linguistics) , matrix (chemical analysis) , metallurgy , telecommunications , linguistics , philosophy , computer science

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