Open AccessVERIFICATION OF RELIABILITY TECHNICAL DEVICES THROUGH RESOLVING PROBABILITY OF FAILURE AND FAILURE
Author(s) -
J W Akhmetov,
S M Seitova,
D B Toibazarov,
G T Kadyrbayeva,
A U Dauletkulova,
G B Issayeva
Publication year - 2018
Language(s) - English
DOI - 10.32014/2018.2518-1726.7
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , reliability theory , probability theory , failure rate , mathematical theory , engineering , mathematics , statistics , power (physics) , physics , quantum mechanics