Open AccessAnalysis of the Metrological Reliability – Study on Simulated and Experimental Data
Author(s) -
Ramona Clinciu,
AUTHOR_ID
Publication year - 2021
Publication title -
recent
Language(s) - English
Resource type - Journals
eISSN - 2065-4529
pISSN - 1582-0246
DOI - 10.31926/recent.2021.64.081
Subject(s) - reliability (semiconductor) , reliability engineering , metrology , computer science , statistics , engineering , mathematics , physics , thermodynamics , power (physics)