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Investigation of a HPGe Detector’s Geometry Using X-Ray Computed Tomography in Collaboration with Monte Carlo Method
Author(s) -
H. I. Khedr,
Mohamed Abdelati,
K.M. El Kourghly
Publication year - 2019
Publication title -
international journal of engineering and applied sciences
Language(s) - English
Resource type - Journals
ISSN - 2394-3661
DOI - 10.31873/ijeas.6.8.2019.08
Subject(s) - monte carlo method , detector , x ray , geometry , semiconductor detector , computed tomography , physics , tomography , materials science , optics , mathematics , medicine , statistics , radiology

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