Open AccessTHE FRACTAL SIMULATION IMAGE OF ATOM OF SILICON IN MICROELECTRONICS
Author(s) -
Leonid Mikhaylovich Makarov,
S. Protasenya
Publication year - 2018
Publication title -
trudy učebnyh zavedenij svâzi
Language(s) - English
Resource type - Journals
eISSN - 2712-8830
pISSN - 1813-324X
DOI - 10.31854/1813-324x-2018-2-91-98
Subject(s) - microelectronics , fractal , silicon , atom (system on chip) , materials science , image (mathematics) , optoelectronics , engineering physics , computer science , engineering , artificial intelligence , mathematics , embedded system , mathematical analysis