Open AccessDifferent Casues For Reduction Of Lekage Current In Sram:A State Of The Art
Author(s) -
Manickam Kavitha
Publication year - 2020
Language(s) - English
DOI - 10.31838/jvcs/02.01.05
Subject(s) - dram , static random access memory , leakage (economics) , cmos , computer science , electrical engineering , electronic engineering , embedded system , computer hardware , engineering , economics , macroeconomics