Open AccessStructural Characterization of RF-Sputtered CZTS Thin Films
Author(s) -
K A Mustapha,
A. U. Moreh,
H.T. Sulu
Publication year - 2019
Publication title -
international journal of advances in scientific research and engineering
Language(s) - English
Resource type - Journals
ISSN - 2454-8006
DOI - 10.31695/ijasre.2019.33481
Subject(s) - kesterite , czts , materials science , thin film , crystallite , diffractometer , substrate (aquarium) , sputter deposition , ternary operation , sputtering , characterization (materials science) , solar cell , analytical chemistry (journal) , crystallography , mineralogy , optoelectronics , composite material , metallurgy , nanotechnology , scanning electron microscope , chemistry , oceanography , chromatography , geology , computer science , programming language