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OPTOMECHANICAL TRANSDUCER-BASED SOFT AND HIGH FREQUENCY NANOSCALE CANTILEVER FOR ATOMIC FORCE MICROSCOPY
Author(s) -
Shinmo An,
Jin Zou,
Glenn Holland,
Jungseok Chae,
Andrea Centrone,
Vladimir Aksyuk
Publication year - 2016
Publication title -
1998 solid-state, actuators, and microsystems workshop technical digest
Language(s) - English
Resource type - Conference proceedings
DOI - 10.31438/trf.hh2016.71
Subject(s) - cantilever , materials science , nanoscopic scale , resonator , transducer , microscopy , non contact atomic force microscopy , q factor , optoelectronics , atomic force microscopy , nanomechanics , optics , atomic force acoustic microscopy , sensitivity (control systems) , bandwidth (computing) , nanotechnology , conductive atomic force microscopy , magnetic force microscope , acoustics , physics , composite material , electronic engineering , magnetization , quantum mechanics , magnetic field , computer network , engineering , computer science

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