Open AccessAPPLICATION OF A PREDICTION METHODOLOGY FOR MEMS RELIABILITY IN SHOCK ENVIRONMENTS
Author(s) -
Michael Naumann,
Daming Lin,
A. McNeil,
G. Li,
Jan Mehner
Publication year - 2012
Language(s) - English
Resource type - Conference proceedings
DOI - 10.31438/trf.hh2012.129
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , microelectromechanical systems , shock (circulatory) , engineering , materials science , physics , medicine , power (physics) , quantum mechanics , optoelectronics