Open AccessFORCE-DISTANCE SPECTROSCOPY: A GENERIC METHOD TO DETERMINE THE YOUNG'S MODULUS OF FREESTANDING NANOSTRUCTURES
Author(s) -
Qihua Xiong,
Srinivas Tadigadapa,
Peter Eklund
Publication year - 2006
Publication title -
1998 solid-state, actuators, and microsystems workshop technical digest
Language(s) - English
Resource type - Conference proceedings
DOI - 10.31438/trf.hh2006.93
Subject(s) - nanowire , materials science , modulus , force spectroscopy , deflection (physics) , young's modulus , nanostructure , scanning electron microscope , composite material , nanotechnology , optics , atomic force microscopy , physics
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