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Atomic Force Microscope for Planetary Applications
Author(s) -
T. Akiyama,
Sébastian Gautsch,
Ν. F. de Rooij,
U. Staufer,
Ph. Niederman,
L. Howald,
Daniel J. Müller,
A. Tonin,
H.R. Hidber,
W. T. Pike,
M. H. Hecht
Publication year - 2000
Publication title -
1998 solid-state, actuators, and microsystems workshop technical digest
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.31438/trf.hh2000.65
Subject(s) - atomic force microscopy , microscope , magnetic force microscope , astrobiology , computer science , materials science , nanotechnology , optics , physics , magnetization , quantum mechanics , magnetic field

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