
Atomic Force Microscope for Planetary Applications
Author(s) -
S. Gautsch,
T. Akiyama,
N. F. de Rooij,
U. Staufer,
Ph. Niedermann,
L. Howald,
Daniel J. Müller,
A. Tonin,
H. R. Hidber,
W. T. Pike,
M. H. Hecht
Publication year - 2000
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.31438/trf.hh2000.65
Subject(s) - atomic force microscopy , magnetic force microscope , microscope , computer science , astrobiology , materials science , nanotechnology , optics , physics , magnetization , quantum mechanics , magnetic field