Open AccessOn-Chip Eddy Current Sensor for Crack Detection in Metals
Author(s) -
Daniel J. Sadler,
Chang Hwan Ahn
Publication year - 2000
Language(s) - English
Resource type - Conference proceedings
DOI - 10.31438/trf.hh2000.34
Subject(s) - eddy current , eddy current sensor , eddy current testing , chip , materials science , current (fluid) , electronic engineering , computer science , acoustics , electrical engineering , engineering , physics