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Confiabilidade de dispositivos CMOS submetidos à radiação e campo magnético
Author(s) -
André Luiz Perin
Publication year - 2016
Language(s) - Portuguese
Resource type - Dissertations/theses
DOI - 10.31414/ee.2016.t.128528
Subject(s) - cmos , computer science , physics , materials science , reliability engineering , humanities , engineering , optoelectronics , philosophy

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