Open AccessConfiabilidade de dispositivos CMOS submetidos à radiação e campo magnético
Author(s) -
André Perin
Publication year - 2018
Language(s) - Portuguese
Resource type - Dissertations/theses
DOI - 10.31414/ee.2016.t.128528
Subject(s) - cmos , reliability engineering , reliability (semiconductor) , computer science , electrical engineering , physics , engineering , power (physics) , quantum mechanics