Open AccessNovel Defect Detection Using Laser-Based Imaging and TIVA with a Visible Laser
Author(s) -
Mary Ann Miller,
Paiboon Tangyunyong,
Edward I. Cole,
Alejandro A. Pimentel,
Darlene M. Udoni
Publication year - 2013
Publication title -
proceedings - international symposium for testing and failure analysis
Language(s) - English
Resource type - Conference proceedings
ISSN - 0890-1740
DOI - 10.31399/asm.cp.istfa2013p0392
Subject(s) - materials science , laser , visible spectrum , optics , microscopy , characterization (materials science) , wavelength , optoelectronics , resolution (logic) , computer science , nanotechnology , artificial intelligence , physics
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