Open AccessIddq testing of a CMOS 10-bit charge scaling digital-to-analog converter
Author(s) -
S. Aluri
Publication year - 2003
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_theses.3314
Subject(s) - iddq testing , engineering , cmos , electrical engineering , electronic engineering , current source , voltage , scaling , geometry , mathematics
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