Open AccessIddq testing of a CMOS 10-bit charge scaling digital-to-analog converter
Author(s) -
S. Aluri
Publication year - 2022
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_theses.3314
Subject(s) - iddq testing , cmos , engineering , electrical engineering , electronic engineering , current source , voltage , scaling , geometry , mathematics