Open Access[Delta] IDDQ testing of a CMOS 12-bit charge scaling digital-to-analog converter
Author(s) -
Kalyan Golla
Publication year - 2006
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_theses.2809
Subject(s) - iddq testing , cmos , cascode , engineering , electronic engineering , electrical engineering , voltage , built in self test , scaling , transistor , amplifier , geometry , mathematics
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