Open AccessTesting a CMOS operational amplifier circuit using a combination of oscillation and IDDQ test methods
Author(s) -
Pavan K Alli
Publication year - 2022
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_theses.1786
Subject(s) - iddq testing , testability , fault coverage , electronic engineering , built in self test , engineering , cmos , robustness (evolution) , design for testing , automatic test pattern generation , fault detection and isolation , electronic circuit , electrical engineering , reliability engineering , biochemistry , chemistry , actuator , gene