Open AccessTesting a CMOS operational amplifier circuit using a combination of oscillation and IDDQ test methods
Author(s) -
Pavan Alli
Publication year - 2004
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_theses.1786
Subject(s) - iddq testing , testability , electronic engineering , fault coverage , cmos , engineering , built in self test , robustness (evolution) , design for testing , electronic circuit , automatic test pattern generation , fault detection and isolation , electrical engineering , reliability engineering , biochemistry , chemistry , actuator , gene
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom