Open AccessProgrammable CMOS Analog-to-Digital Converter Design and Testability
Author(s) -
Rajiv Soundararajan
Publication year - 2012
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_dissertations.3552
Subject(s) - oversampling , decimation , integrator , delta sigma modulation , cmos , electronic engineering , testability , engineering , electrical engineering , filter (signal processing) , voltage , reliability engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom