Open AccessQuiescent current testing of CMOS data converters
Author(s) -
Siva Yellampalli
Publication year - 2022
Language(s) - Uncategorized
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_dissertations.2087
Subject(s) - iddq testing , cmos , electronic engineering , electronic circuit , very large scale integration , engineering , subthreshold conduction , mixed signal integrated circuit , integrated circuit , electrical engineering , chip , digital electronics , transistor , voltage