Open AccessQuiescent current testing of CMOS data converters
Author(s) -
Siva Yellampalli
Publication year - 2008
Language(s) - Uncategorized
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_dissertations.2087
Subject(s) - iddq testing , cmos , electronic engineering , very large scale integration , electronic circuit , engineering , subthreshold conduction , mixed signal integrated circuit , integrated circuit , electrical engineering , chip , digital electronics , transistor , voltage
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