Open AccessQuantum optical improvements in metrology, sensing, and lithography
Author(s) -
Sean D. Huver
Publication year - 2009
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31390/gradschool_dissertations.1058
Subject(s) - quantum sensor , photonics , quantum , quantum metrology , physics , optoelectronics , low emissivity , lithography , quantum optics , quantum technology , computer science , emissivity , optics , engineering physics , open quantum system , quantum mechanics
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