Open AccessAmplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
Author(s) -
Hector Hugo Sánchez Hernández,
Juan Manuel Peréz-Abarca,
Agustín Santiago Alvarado,
Ángel S. Cruz-Félix
Publication year - 2022
Publication title -
revista mexicana de física/revista mexicana de física
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.181
H-Index - 25
eISSN - 2683-2224
pISSN - 0035-001X
DOI - 10.31349/revmexfis.68.031304
Subject(s) - materials science , optics , surface plasmon resonance , polarization (electrochemistry) , plasmon , surface plasmon , prism , dielectric , wavelength , ellipsometry , amplitude , total internal reflection , excited state , amplitude modulation , electromagnetic radiation , optoelectronics , frequency modulation , thin film , physics , nanoparticle , chemistry , nanotechnology , atomic physics , radio frequency , telecommunications , computer science
In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the SPR at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and ∆.