Open AccessEstimation of reliability measures for artificial neural networks
Author(s) -
Sudnya Bhupendra Shroff
Publication year - 2020
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.31274/rtd-20201222-0
Subject(s) - artificial neural network , reliability (semiconductor) , estimation , artificial intelligence , computer science , reliability engineering , machine learning , engineering , systems engineering , physics , power (physics) , quantum mechanics