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A Fast Method of Generating Pseudo-Random Vectors of High Dimension for testing Systems-on-Chip
Author(s) -
M.I. Dyabin,
А. В. Решетников,
Evgeny A. Saksonov
Publication year - 2021
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2021-4-86-91
Subject(s) - chip , dimension (graph theory) , random testing , computer science , parallel computing , mathematics , combinatorics , machine learning , telecommunications , test case , regression analysis

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