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Peculiarities of Appearance and Registration of the Latchup in CMOS VLSI under Uniform Pulsed Laser Irradiation
Author(s) -
Ivan I. Shvetsov-Shilovskiy
Publication year - 2021
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2021-4-176-181
Subject(s) - very large scale integration , irradiation , cmos , laser , materials science , pulsed laser , optoelectronics , optics , electronic engineering , engineering , physics , nuclear physics

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