Open AccessComparative Analysis of the Error Pulses Formation at Outputs of Ttriple Majority CMOS Gates During Charge Collecting from Tracks of Single Ionizing Particles
Author(s) -
Yu. V. Katunin,
V. Ya. Stenin
Publication year - 2021
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2021-3-130-139
Subject(s) - cmos , ionizing radiation , charge (physics) , optoelectronics , physics , error analysis , electrical engineering , engineering , nuclear physics , irradiation , mathematics , particle physics