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Model for detecting counterfeit recovered SRAM based on accelerated aging
Author(s) -
V.N. Starcev,
А. В. Семенов
Publication year - 2020
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2020-4-225-230
Subject(s) - counterfeit , static random access memory , computer science , embedded system , computer hardware , history , archaeology

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