
Estimation of single event effect sensitivity in VLSI to neutron irradiation
Author(s) -
A. I. Chumakov
Publication year - 2020
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2020-2-153-157
Subject(s) - sensitivity (control systems) , event (particle physics) , very large scale integration , neutron irradiation , neutron , irradiation , computer science , nuclear physics , reliability engineering , nuclear engineering , physics , engineering , electronic engineering , embedded system , astrophysics