Open AccessSearch for a rational structure of a test generator for subsystems of built-in self-testing of digital circuits
Author(s) -
N.V. Bykhanova,
Sergey Mosin
Publication year - 2020
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2020-1-89-94
Subject(s) - generator (circuit theory) , digital pattern generator , digital electronics , test (biology) , electronic circuit , computer science , electronic engineering , computer hardware , reliability engineering , engineering , electrical engineering , power (physics) , physics , paleontology , quantum mechanics , biology