Open AccessDisadvantages of domestic analytical-experimental methods prediction of reliability of the integrated circuits
Author(s) -
Andrew V. Solovev,
A.V. Seletskiy
Publication year - 2020
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2020-1-76-81
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , electronic circuit , electronic engineering , engineering , electrical engineering , physics , power (physics) , quantum mechanics