
Taking into Account the Simultaneous Effect of Low Temperatures and Penetrating Radiation on the Characteristics of the Bipolar and JFETs in the Circuit Simulation
Author(s) -
О. В. Дворников,
Vladimir A. Tchekhovski,
N. Prokopenko,
Ya. D. Galkin,
А. В. Кунц
Publication year - 2020
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2020-1-46-55
Subject(s) - radiation , optoelectronics , materials science , electrical engineering , physics , optics , engineering