Open AccessThe Single Event Upset Forecasting in Digital and Analog Integrated Circuits in SAED 14nm FinFet Technology
Author(s) -
Vazgen Melikyan,
A. Petrosyan,
Artur Kh. Mkhitaryan,
Andranik K. Hayrapetyan,
Zaven M. Avetisyan,
A.E. Mkrtchyan,
Synopsys Armenia Cjsc
Publication year - 2018
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2018-4-76-81
Subject(s) - upset , single event upset , analogue electronics , selected area diffraction , computer science , reliability engineering , electronic circuit , materials science , electronic engineering , engineering , electrical engineering , nanotechnology , static random access memory , mechanical engineering , transmission electron microscopy