Open AccessTechnometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
Author(s) -
А. В. Семенов,
V.N. Starcev,
E.N. Stepanov
Publication year - 2018
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2018-4-143-148
Subject(s) - counterfeit , identification (biology) , electronic circuit , integrated circuit , computer science , engineering , electrical engineering , political science , botany , biology , law