
Principles of Designing Devices for Test Diagnosing of High-speed Microchips and Semiconductor Memory
Author(s) -
A.P. Evdokimov,
Vladimir Ryabtsev,
Aleksej Vladimirovich Melikov
Publication year - 2018
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2018-2-23-30
Subject(s) - semiconductor memory , test (biology) , computer science , memory test , computer hardware , psychology , neuroscience , geology , paleontology , cognition