Open AccessEvolutionary Algorithms of Test Generation for Crosstalk Faults of Digital Circuits
Author(s) -
Y.A. Skobtsov
Publication year - 2018
Publication title -
problemy razrabotki perspektivnyh mikro- i nanoèlektronnyh sistem ...
Language(s) - English
Resource type - Journals
ISSN - 2078-7707
DOI - 10.31114/2078-7707-2018-1-16-22
Subject(s) - crosstalk , computer science , digital electronics , electronic circuit , algorithm , automatic test pattern generation , electronic engineering , engineering , electrical engineering