Reliability and Validity of “L” Test in Young Elderly
Author(s) -
Kaushani Jhaver,
Veena Krishnanand,
Mugdha Oberoi
Publication year - 2019
Publication title -
acta scientific orthopaedics
Language(s) - English
Resource type - Journals
ISSN - 2581-8635
DOI - 10.31080/asor.2019.02.0103
Subject(s) - reliability engineering , reliability (semiconductor) , test (biology) , psychology , engineering , physics , geology , paleontology , power (physics) , quantum mechanics
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