
ATOMIC FORCE MICROSCOPY OF POLYMER NANOPARTICLES
Author(s) -
V.M. Kornilov,
D.D. Karamov,
F.F. Sitdikov,
R.R. Khayretdinov
Publication year - 2022
Publication title -
izvestiâ ufimskogo naučnogo centra rossijskoj akademii nauk
Language(s) - English
Resource type - Journals
ISSN - 2222-8349
DOI - 10.31040/2222-8349-2022-0-1-10-14
Subject(s) - polymer , nanoparticle , atomic force microscopy , substrate (aquarium) , nanotechnology , supramolecular chemistry , materials science , metrology , silicon , microscopy , work (physics) , chemical engineering , chemistry , crystallography , optics , composite material , physics , optoelectronics , thermodynamics , engineering , crystal structure , oceanography , geology
The paper presents the results of an experimental study of polymer nanoparticles on different substrates by atomic force microscopy. The main metrological parameters of polymer nanoparticles are determined, the results are compared with the available data on the supramolecular structure of solid films. It is established that the size and shape of the observed structures, other things being equal, significantly depend on the type of substrate. It is shown that aggregation and self-organization of polymer nanoparticles occurs during the preparation of samples on silicon. The work was carried out with the support of the project "Mirror Laboratories" of the National Research University "Higher School of Economics" and Bashkir State Pedagogical University named after M. Akmulla.