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Investigation of TiNi1-xRhxSn semiconducting solid solution
Author(s) -
Yu. Stadnyk,
L. Romaka,
В. А. Ромака,
Volodymyr Krayovskyy,
A. Horyń,
M. Rokomanuk
Publication year - 2020
Publication title -
vìsnik lʹvìvsʹkogo unìversitetu. serìâ hìmìčna
Language(s) - English
Resource type - Journals
ISSN - 2078-5615
DOI - 10.30970/vch.6101.114
Subject(s) - solid solution , diffractometer , diffraction , electrical resistivity and conductivity , atomic radius , annealing (glass) , materials science , analytical chemistry (journal) , copper , x ray crystallography , phase (matter) , seebeck coefficient , crystallography , chemistry , crystal structure , metallurgy , physics , optics , organic chemistry , chromatography , quantum mechanics

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