z-logo
open-access-imgOpen Access
Integrated accuracy assessment of short-term reliability forecast of radio systems.
Author(s) -
Yu. V. Vasilkov,
Alexander V. Timoshenko,
V.A. ovetov
Publication year - 2020
Publication title -
journal of radio electronics
Language(s) - English
Resource type - Journals
ISSN - 1684-1719
DOI - 10.30898/1684-1719.2020.2.7
Subject(s) - term (time) , reliability engineering , reliability (semiconductor) , computer science , engineering , physics , power (physics) , quantum mechanics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom