
Integrated accuracy assessment of short-term reliability forecast of radio systems.
Author(s) -
Yu.V. Vasilkov,
Alexander V. Timoshenko,
V.A. ovetov
Publication year - 2020
Publication title -
journal of radio electronics
Language(s) - English
Resource type - Journals
ISSN - 1684-1719
DOI - 10.30898/1684-1719.2020.2.7
Subject(s) - term (time) , reliability (semiconductor) , reliability engineering , computer science , engineering , physics , power (physics) , quantum mechanics