Open AccessEffect of thickness on the structure, morphology and A.C conductivity of Bi2S3 thin films
Author(s) -
Bushra A. Hasan
Publication year - 2019
Publication title -
iraqi journal of physics
Language(s) - English
Resource type - Journals
eISSN - 2664-5548
pISSN - 2070-4003
DOI - 10.30723/ijp.v15i33.144
Subject(s) - materials science , thin film , amorphous solid , crystallite , conductivity , dielectric , substrate (aquarium) , analytical chemistry (journal) , morphology (biology) , bismuth , grain size , polarizability , evaporation , composite material , crystallography , optoelectronics , nanotechnology , metallurgy , chemistry , oceanography , physics , chromatography , geology , biology , genetics , thermodynamics , organic chemistry , molecule
Thin films samples of Bismuth sulfide Bi2S3 had deposited onglass substrate using thermal evaporation method by chemicalmethod under vacuum of 10-5 Toor. XRD and AFM were used tocheck the structure and morphology of the Bi2S3 thin films. Theresults showed that the films with law thickness <700 nm were freefrom any diffraction peaks refer to amorphous structure while filmswith thickness≥700 nm was polycrystalline. The roughness decreaseswhile average grain size increases with the increase of thickness. TheA.C conductivity as function of frequency had studied in thefrequency range (50 to 5x106 Hz). The dielectric constant,polarizability showed significant dependence upon the variation ofthickness.