Open AccessVARIATION OF CAPACITIVE REACTANCE OF COUPLED MICROSTRIP LINE STRUCTURE WITH WIDTH OF THE SIMILAR METAL STRIPS
Author(s) -
Rajeev Ranjan Kumar,
Surinder Singh
Publication year - 2020
Publication title -
international journal of electronics engineering and application
Language(s) - English
Resource type - Journals
ISSN - 2321-3477
DOI - 10.30696/ijeea.viii.ii.2020.22-28
Subject(s) - reactance , strips , capacitive sensing , microstrip , electrical reactance , materials science , line width , variation (astronomy) , capacitive coupling , line (geometry) , electrical engineering , composite material , optics , inductance , geometry , voltage , engineering , physics , mathematics , astrophysics