Open AccessThe Results of Simulation of the process of occurrence of damages to the Semiconductor Elements of Radio-Electronic Equipment under the influence of Multi-Frequency Signals of Short Duration
Author(s) -
Iryna Smyrnova
Publication year - 2020
Publication title -
international journal of advanced trends in computer science and engineering
Language(s) - English
Resource type - Journals
ISSN - 2278-3091
DOI - 10.30534/ijatcse/2020/86932020
Subject(s) - damages , duration (music) , radio frequency , process (computing) , electronic equipment , computer science , engineering , environmental science , electrical engineering , acoustics , telecommunications , physics , political science , law , operating system